@InProceedings{NakamatsuPeSoOkFoRaAb:2017:InTrPr,
author = "Nakamatsu, Sandra and Peres, Marcelos L. and Soares, Dem{\'e}trio
A. W. and Okassaki, Anderson K. and Fornari, Celso Israel and
Rappl, Paulo Henrique de Oliveira and Abramof, Eduardo",
affiliation = "{} and {} and {} and {} and {Instituto Nacional de Pesquisas
Espaciais (INPE)} and {Instituto Nacional de Pesquisas Espaciais
(INPE)} and {Instituto Nacional de Pesquisas Espaciais (INPE)}",
title = "Investigation of transport properties on PbTe/Pb1-xSnxTe
heterostructures",
booktitle = "Resumos...",
year = "2017",
organization = "Brazilian Workshop on Semiconductor Physics, 18. (BWSP)",
abstract = "PbTe compounds have been used for the development of infrared
photodetectors and diode lasers [1] over the decades. Introduction
of Sn atoms makes this material even more interesting for
practical applications as well as from the basics physics point of
view. According to the band inversion model, the gap of Pb1-xSnxTe
decreases as Sn composition increases, and vanishes for an
intermediate alloy composition. Further increasing of Sn
concentration leads to the band inversion and the energy gap
starts to increase up to the SnTe value. Very recently, it was
discovered that in the region of band inversion, transition from
metallic to crystalline topological insulator (TCI) occurs [3].
Recent theoretical work demonstrated that the PbTe/Pb1-xSnxTe
heterostructures can present topological states in the interface
of the heterojunction. Such an interface of PbTe and
Pb1\−xSnxTe, at which four Dirac cones appear, is analogous
to the surface of a weak TI [4]. In this work we perform
electrical characterization in PbTe/Pb1-xSnxTe films for different
values of x close to the band inversion in order to verify the
existence a single gapless helical state in the [111] direction at
the heterostructure interface. Morfological characterization will
also be performed in order to provide a detailed view of these new
structures. We hope that this work contribute to a better
comprehension of the nature of topological insulators based on
IV-VI compounds. Acknowledgments: The authors would like to
acknowledge CAPES and FAPEMIG for support. References: [1] I. U.
Arachchige and M. G. Kanatzidis, Nano Lett. 9 (4), 1583 (2009);
[2] R. Jaramillo et al, Jour. Appl. Phys. 119, 035101 (2016); [3]
P. Dziawa, Nature Materials 11, 1023 (2012).",
conference-location = "Maresias, SP",
conference-year = "14-18 ago.",
language = "en",
targetfile = "abramof_investigation.pdf",
urlaccessdate = "27 abr. 2024"
}